Innovation  in Test and Measurement

June 21 2010

Q-Star Test and BEST-IIC announce a strategic cooperation – serving the Taiwanese market with solutions targeting product quality improvement and test cost and time-to-volume reduction, based on the application of Q-Star’s unique supply current (IDD) test and measurement solutions combined with BEST-IIC’s test program development services.

Q-Star Test, an innovative supplier of precision IC test and measurement instrumentation and a global leader in advanced high speed high accurate current test and measurement solutions, announces that Back End Service Trade Intelligence Integration Corp. (BEST-IIC), a Taiwanese semiconductor testing firm, has become a distributor of Q-Star Test products. The agreement extends sales and technology support for Q-Star’s technology solutions throughout Taiwan.

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June 15 2010

Q-Star Test nv, Global leader in advanced high speed and high accurate current test and measurement solutions, adds Kingsly Instrumentation and Communication Pvt. Ltd (KICPL) as India Distributor

Q-Star Test, an innovative supplier of precision IC test and measurement instrumentation and a global leader in advanced high speed high accurate current test and measurement solutions, announces that Kingsly Instrumentation and Communication Pvt. Ltd (KICPL), an Indian Company engaged in providing Test & Measurement and Data Conversion solutions, has become a distributor of Q-Star Test products. The agreement extends sales and technology support for Q-Star’s technology solutions throughout India.

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March 2010

Q-Star Test and Ridgetop Group Inc. jointly present a tutorial at DATE2010.

Jointly we, Q-Star Test and our partner Ridgetop Group Inc., presented a tutorial on “IC Yield, Reliability and Prognostic Methods using Nanoscale test Structures” at the Design, Automation and Test in Europe (DATE 2010) conference. This tutorial (DATE Tutorial E1) is part of the annual IEEE Computer Society TTTC Test Technology Educational Program (TTEP) and took take place on Monday, March 8, 2010 from 9:30 until noon in room ‘Konferenz 3’ of the DATE venue.
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