You are invited to attend a tutorial on

“IC Yield, Reliability and Prognostic Methods using Nanoscale test Structures”

jointly presented by Q-Star Test and our partner Ridgetop Group Inc. at the Design, Automation and Test in Europe (DATE 2010) conference. This tutorial (DATE Tutorial E1) is part of the annual IEEE Computer Society TTTC Test Technology Educational Program (TTEP) and will take place on Monday, March 8, 2010 from 9:30 until noon in room ‘Konferenz 3’ of the DATE venue. The tutorial will address the following theme:

The mounting issues of decreased yield and reliability from nanoscale IC processes require advanced approaches to the measurement and mitigation of device degradation and variance. Shrinking process geometries, with their corresponding reduction in device lifetimes, have broad implications to critical applications having long intended design lifetimes. Nanoscale transistor sizes are emerging as a major concern to the long term reliability of safety-critical systems in aerospace and automotive applications. Die-level prognostic test structures can detect and help mitigate unexpected failures in critical systems. These test structures, with variance measurement capabilities, also provide an effective platform for improved process-aware design for improved yields. This tutorial will address concepts of in-situ test structures as a solution to yield, reliability and prognostic applications and include practical application examples.

If you are a decision maker, manager, product engineer, designer or test engineer, then you can benefit from our solutions. In cooperation we offer a total package solution consisting of test program optimization, test program engineering & conversion, Iddx/Issx application support and electronic health monitoring. We assist you in achieving the required test coverage and lowering your test costs based on our unique high performance supply/ground current test solutions. We offer you the right solution to assure quality and reliability of your products and to test your high performance DSM and Nanoscale ICs as well as your low power semiconductor devices.

We are looking forward to meeting you in Dresden. Contact us at events@qstar.be to schedule a meeting and remember: “Real surprises await those who choose wisely”.

Q-Star Test is a leading supplier of innovative solutions for test cost reduction and product quality improvement, offers best in class intelligent Iddx and Issx measurement equipment, DFT and Test consulting and engineering services, Electronic health management and Prognostic solutions, as well as electronic and PCB engineering services for the development of prototypes and small series productions.

Ridgetop Group Inc. is the world leader in providing advanced electronic prognostics and health management (ePHM) solutions, semiconductor IP blocks, and built-in self-test (BIST) solutions for critical applications. Founded in 2000 with the purpose of introducing revolutionary tools to improve performance of mission-critical electronic systems, Ridgetop has built an impressive list of customers in North America, Europe, and Asia.

Let Q-Star Test be your Guiding Star.

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